TY  - JOUR
A1  - Behner, H.
A1  - Wecker, J.
A1  - Matthée, Th.
A1  - Samwer, Konrad
T1  - XPS study of the interface reactions between buffer layers for HTSC thin films and silicon
T2  - Surface and Interface Analysis
Y1  - 1992
UR  - https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/18230
SN  - 1096-9918
VL  - 18
IS  - 9
SP  - 685
EP  - 690
PB  - Wiley
CY  - Weinheim
ER  -