TY  - CHAP
A1  - Schuler, H.
A1  - Klimm, Stefan
A1  - Horn, Siegfried R.
A2  - Moss, Steven C.
A2  - Cammarata, Robert C.
A2  - Chason, Eric H.
A2  - Einstein, Theodore L.
A2  - Williams, Ellen D.
A2  - Lla, Daryush
T1  - Correlation between structural and electronic properties of strained V2O3 thin films
T2  - Thin films - structure and morphology: symposium held December 2 - 6, 1996, Boston, Massachusetts, USA
Y1  - 1997
UR  - https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/24969
SN  - 1558993452
SP  - 451
EP  - 456
PB  - Materials Research Society
CY  - Pittsburgh, PA
ER  -