Degradation properties of organic light‐emitting diodes with modified interface charge density via dipolar doping studied by displacement current measurement

  • Accumulated charges at the interfaces of organic light-emitting diodes (OLEDs) often induce exciton quenching and lead to device degradation. This work delves into the correlations of the interface charge accumulation and degradation properties of tris(8-quinolinolato)aluminum (Alq3)-based OLEDs. The interface accumulated charge density is modified by spontaneous orientation polarization (SOP) induced in the hole transport layer (HTL) by means of dipolar doping, where N,N′-bis(1-naphthyl)-N,N′-diphenyl-1,1′-biphenyl-4,4′-diamine (NPB) or tris(4-carbazoyl-9-ylphenyl) amine (TCTA) is employed as a hole transport material and 2,2′,2″-(1,3,5-Benzinetriyl)-tris(1-phenyl-1-H-bensimidazole) (TPBi) as a dipolar dopant. It is confirmed that NPB cation acts as an exciton quencher, but TCTA cation does not, depending on the spectral overlap of Alq3 emission and the absorption of the respective cations. On the other hand, the TCTA devices degrade much faster than the NPB devices. Moreover, theAccumulated charges at the interfaces of organic light-emitting diodes (OLEDs) often induce exciton quenching and lead to device degradation. This work delves into the correlations of the interface charge accumulation and degradation properties of tris(8-quinolinolato)aluminum (Alq3)-based OLEDs. The interface accumulated charge density is modified by spontaneous orientation polarization (SOP) induced in the hole transport layer (HTL) by means of dipolar doping, where N,N′-bis(1-naphthyl)-N,N′-diphenyl-1,1′-biphenyl-4,4′-diamine (NPB) or tris(4-carbazoyl-9-ylphenyl) amine (TCTA) is employed as a hole transport material and 2,2′,2″-(1,3,5-Benzinetriyl)-tris(1-phenyl-1-H-bensimidazole) (TPBi) as a dipolar dopant. It is confirmed that NPB cation acts as an exciton quencher, but TCTA cation does not, depending on the spectral overlap of Alq3 emission and the absorption of the respective cations. On the other hand, the TCTA devices degrade much faster than the NPB devices. Moreover, the device lifetime is similar or even shorter for the doped devices despite less interface charge density. These results suggest that holes accumulated at the interface between the hole transport material and Alq3 due to SOP are not mainly involved in the degradation mechanism. Furthermore, it is found that the charge traps generated due to degradation do not act as exciton quenchers, suggesting that they rather act as nonradiative recombination centers.show moreshow less

Export metadata

Statistics

Number of document requests

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:Mihiro Takeda, Alexander HofmannORCiDGND, Wolfgang BrüttingORCiDGND, Yutaka Noguchi
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/118179
ISSN:2199-160XOPAC
Parent Title (English):Advanced Electronic Materials
Publisher:Wiley
Place of publication:Weinheim
Type:Article
Language:English
Year of first Publication:2025
Publishing Institution:Universität Augsburg
Release Date:2025/01/21
DOI:https://doi.org/10.1002/aelm.202400788
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik IV
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Latest Publications (not yet published in print):Aktuelle Publikationen (noch nicht gedruckt erschienen)
Licence (German):CC-BY 4.0: Creative Commons: Namensnennung (mit Print on Demand)