High-resolution capacitance dilatometry of microscopically thin samples using a miniature dilatometer

  • We present a novel application of our high-resolution capacitance dilatometer, specifically engineered for the precise characterization of quantum materials. These materials, which often appear as ultrathin, platelet-shaped crystals, are known for exotic phenomena such as superconductivity, topological order, and quantum spin liquid. However, these crystals seldom reach macroscopic dimensions, making them unsuitable for conventional dilatometry techniques. By introducing a modified sample-mounting configuration, our design enables high-resolution measurements of thermal expansion and magnetostriction along in-plane crystallographic directions in samples with thicknesses well below 500 μm. Validation measurements using a Quantum Design PPMS system confirm reliable performance for a 300 μm-thick silver platelet, relatively hard ferromagnetic EuB6 single crystals down to 50 μm, and a 40 μm-thin, soft AgCrS2 single crystal. This advancement significantly broadens the applicability ofWe present a novel application of our high-resolution capacitance dilatometer, specifically engineered for the precise characterization of quantum materials. These materials, which often appear as ultrathin, platelet-shaped crystals, are known for exotic phenomena such as superconductivity, topological order, and quantum spin liquid. However, these crystals seldom reach macroscopic dimensions, making them unsuitable for conventional dilatometry techniques. By introducing a modified sample-mounting configuration, our design enables high-resolution measurements of thermal expansion and magnetostriction along in-plane crystallographic directions in samples with thicknesses well below 500 μm. Validation measurements using a Quantum Design PPMS system confirm reliable performance for a 300 μm-thick silver platelet, relatively hard ferromagnetic EuB6 single crystals down to 50 μm, and a 40 μm-thin, soft AgCrS2 single crystal. This advancement significantly broadens the applicability of capacitance dilatometry, providing a powerful platform for investigating emergent phenomena in reduced-dimensional quantum systems.show moreshow less

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Metadaten
Author:R. Küchler, Soumendra Nath PanjaORCiD, S. Wirth, Philipp GegenwartORCiDGND
URN:urn:nbn:de:bvb:384-opus4-1283838
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/128383
ISSN:0034-6748OPAC
ISSN:1089-7623OPAC
Parent Title (English):Review of Scientific Instruments
Publisher:AIP Publishing
Place of publication:Melville, NY
Type:Article
Language:English
Year of first Publication:2026
Publishing Institution:Universität Augsburg
Release Date:2026/02/27
Volume:97
Issue:2
First Page:025209
DOI:https://doi.org/10.1063/5.0300507
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik VI
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Licence (German):CC-BY 4.0: Creative Commons: Namensnennung