SAW tomography-spatially resolved charge detection by SAW in semiconductor structures for imaging applications

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Author:M. Streibl, F. Beil, Achim WixforthORCiDGND, C. Kadow, A. C. Gossard
Frontdoor URL
Parent Title (English):1999 IEEE Ultrasonics Symposium: Proceedings, 17-20 October 1999, Caesars Tahoe, NV, USA
Place of publication:Piscataway, NJ
Editor:S. C. Schneider, M. Levy, B. R. McAvoy
Type:Part of a Book
Year of first Publication:1999
Publishing Institution:Universität Augsburg
Release Date:2020/05/09
First Page:11
Last Page:14
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik I
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Licence (German):Deutsches Urheberrecht