SAW tomography-spatially resolved charge detection by SAW in semiconductor structures for imaging applications
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| Author: | M. Streibl, F. Beil, Achim WixforthORCiDGND, C. Kadow, A. C. Gossard |
|---|---|
| URN: | urn:nbn:de:bvb:384-opus4-633239 |
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/63323 |
| ISBN: | 0780357221OPAC |
| Parent Title (English): | 1999 IEEE Ultrasonics Symposium: Proceedings, 17-20 October 1999, Caesars Tahoe, NV, USA |
| Publisher: | IEEE |
| Place of publication: | Piscataway, NJ |
| Editor: | S. C. Schneider, M. Levy, B. R. McAvoy |
| Type: | Part of a Book |
| Language: | English |
| Year of first Publication: | 1999 |
| Publishing Institution: | Universität Augsburg |
| Release Date: | 2020/05/09 |
| First Page: | 11 |
| Last Page: | 14 |
| DOI: | https://doi.org/10.1109/ultsym.1999.849346 |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik | |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik I | |
| Dewey Decimal Classification: | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
| Licence (German): |  Deutsches Urheberrecht |
