Effect of percolation on structural and electrical properties of MIC processed SiGe/Al multilayers

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Author:Marc Erik LindorfORCiDGND, H. Rohrmann, G. Span, Manfred AlbrechtGND
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/65159
ISSN:0361-5235OPAC
ISSN:1543-186XOPAC
Parent Title (English):Journal of Electronic Materials
Publisher:Springer
Place of publication:Berlin [u.a.]
Type:Article
Language:English
Year of first Publication:2015
Release Date:2019/11/19
Tag:Electrical and Electronic Engineering; Materials Chemistry; Electronic, Optical and Magnetic Materials; Condensed Matter Physics
Volume:45
Issue:3
First Page:1730
Last Page:1733
DOI:https://doi.org/10.1007/s11664-015-4190-x
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik IV