Effect of percolation on structural and electrical properties of MIC processed SiGe/Al multilayers
| Author: | Marc Erik LindorfORCiDGND, H. Rohrmann, G. Span, Manfred AlbrechtORCiDGND |
|---|---|
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/65159 |
| ISSN: | 0361-5235OPAC |
| ISSN: | 1543-186XOPAC |
| Parent Title (English): | Journal of Electronic Materials |
| Publisher: | Springer |
| Place of publication: | Berlin [u.a.] |
| Type: | Article |
| Language: | English |
| Year of first Publication: | 2015 |
| Release Date: | 2019/11/19 |
| Tag: | Electrical and Electronic Engineering; Materials Chemistry; Electronic, Optical and Magnetic Materials; Condensed Matter Physics |
| Volume: | 45 |
| Issue: | 3 |
| First Page: | 1730 |
| Last Page: | 1733 |
| DOI: | https://doi.org/10.1007/s11664-015-4190-x |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik | |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik IV |
