Evaluation of thermal and growth stresses in heteroepitaxial AlN thin films formed on (0001) sapphire by pulsed laser ablation
Author: | J. Keckes, S. Six, W. Tesch, R. Resel, Bernd RauschenbachORCiD |
---|---|
Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/123529 |
ISSN: | 0022-0248OPAC |
Parent Title (English): | Journal of Crystal Growth |
Publisher: | Elsevier BV |
Type: | Article |
Language: | English |
Year of first Publication: | 2002 |
Publishing Institution: | Universität Augsburg |
Release Date: | 2025/07/22 |
Volume: | 240 |
Issue: | 1-2 |
First Page: | 80 |
Last Page: | 86 |
DOI: | https://doi.org/10.1016/s0022-0248(02)00877-1 |
Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |