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Evaluation of thermal and growth stresses in heteroepitaxial AlN thin films formed on (0001) sapphire by pulsed laser ablation

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Metadaten
Author:J. Keckes, S. Six, W. Tesch, R. Resel, Bernd RauschenbachORCiD
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/123529
ISSN:0022-0248OPAC
Parent Title (English):Journal of Crystal Growth
Publisher:Elsevier BV
Type:Article
Language:English
Year of first Publication:2002
Publishing Institution:Universität Augsburg
Release Date:2025/07/22
Volume:240
Issue:1-2
First Page:80
Last Page:86
DOI:https://doi.org/10.1016/s0022-0248(02)00877-1
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik