• search hit 6 of 26
Back to Result List

Microscopy of SiC layers grown by C60 deposition on Si(100)

Export metadata

Statistics

Number of document requests

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:Roland Scholz, Ulrich Gösele, Kerstin VolzGND, Bernd RauschenbachORCiD
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/25941
ISSN:1347-4065OPAC
Parent Title (English):Japanese Journal of Applied Physics
Publisher:IOP Publishing
Place of publication:Bristol
Type:Article
Language:English
Year of first Publication:1998
Publishing Institution:Universität Augsburg
Release Date:2017/07/21
Volume:37
Issue:11R
First Page:6090
Last Page:6093
DOI:https://doi.org/10.1143/JJAP.37.6090
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik