XPS study of the interface reactions between buffer layers for HTSC thin films and silicon
| Author: | H. Behner, J. Wecker, Th. Matthée, Konrad SamwerORCiDGND |
|---|---|
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/18230 |
| ISSN: | 1096-9918OPAC |
| Parent Title (English): | Surface and Interface Analysis |
| Publisher: | Wiley |
| Place of publication: | Weinheim |
| Type: | Article |
| Language: | English |
| Year of first Publication: | 1992 |
| Release Date: | 2017/07/21 |
| Volume: | 18 |
| Issue: | 9 |
| First Page: | 685 |
| Last Page: | 690 |
| DOI: | https://doi.org/10.1002/sia.740180909 |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |
