Epitaxial and thermal strains in oxidic thin films on Si(001)
| Author: | Th. Matthée, J. Wecker, A. Bardal, Konrad SamwerORCiDGND |
|---|---|
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/21615 |
| ISSN: | 0040-6090OPAC |
| Parent Title (English): | Thin Solid Films |
| Publisher: | Elsevier |
| Place of publication: | Amsterdam |
| Type: | Article |
| Language: | English |
| Year of first Publication: | 1995 |
| Release Date: | 2017/07/21 |
| Volume: | 258 |
| Issue: | 1-2 |
| First Page: | 264 |
| Last Page: | 267 |
| DOI: | https://doi.org/10.1016/0040-6090(94)06396-6 |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |
