Microscopy of SiC layers grown by C60 deposition on Si(100)
| Author: | Roland Scholz, Ulrich Gösele, Kerstin VolzGND, Bernd RauschenbachORCiD |
|---|---|
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/25941 |
| ISSN: | 1347-4065OPAC |
| Parent Title (English): | Japanese Journal of Applied Physics |
| Publisher: | IOP Publishing |
| Place of publication: | Bristol |
| Type: | Article |
| Language: | English |
| Year of first Publication: | 1998 |
| Release Date: | 2017/07/21 |
| Volume: | 37 |
| Issue: | 11R |
| First Page: | 6090 |
| Last Page: | 6093 |
| DOI: | https://doi.org/10.1143/JJAP.37.6090 |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |
