XTEM characterisation of tungsten implanted SiC thin films on silicon for field emission devices
| Author: | Jörg K. N. Lindner, W. M. Tsang, S. P. Wong, J. B. Xu, I. H. Wilson |
|---|---|
| Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/31904 |
| Parent Title (English): | Thin Solid Films |
| Publisher: | Elsevier |
| Place of publication: | Amsterdam |
| Type: | Article |
| Language: | English |
| Year of first Publication: | 2003 |
| Release Date: | 2017/07/21 |
| Volume: | 426 |
| Issue: | 1-2 |
| First Page: | 417 |
| Last Page: | 421 |
| DOI: | https://doi.org/10.1016/S0040-6090(02)01194-X |
| Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
| Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |
