SiC precipitates formes in Si by simultaneous dual beam implantation of C+ and Si+ ions
Author: | R. Kögler, F. Eichhorn, A. Mücklich, H. Reuther, V. Heera, W. Skorupa, Jörg K. N. Lindner |
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Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/31906 |
ISSN: | 0168-583xOPAC |
Parent Title (English): | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
Publisher: | Elsevier |
Place of publication: | Amsterdam |
Type: | Article |
Language: | English |
Year of first Publication: | 2003 |
Release Date: | 2017/07/21 |
Volume: | 206 |
First Page: | 989 |
Last Page: | 993 |
DOI: | https://doi.org/10.1016/S0168-583X(03)00908-X |
Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |