SiC precipitates formes in Si by simultaneous dual beam implantation of C+ and Si+ ions

Export metadata

Statistics

Number of document requests

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:R. Kögler, F. Eichhorn, A. Mücklich, H. Reuther, V. Heera, W. Skorupa, Jörg K. N. Lindner
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/31906
ISSN:0168-583xOPAC
Parent Title (English):Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Publisher:Elsevier
Place of publication:Amsterdam
Type:Article
Language:English
Year of first Publication:2003
Release Date:2017/07/21
Volume:206
First Page:989
Last Page:993
DOI:https://doi.org/10.1016/S0168-583X(03)00908-X
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik