Controlled strained layer epitaxial growth of EuTiO3 on buffered silicon

  • In this work, we show the epitaxial growth of (111)-oriented EuTiO thin films on (001)-oriented silicon with an in situ grown yttria-stabilized zirconia (YSZ) buffer layer by pulsed laser deposition. X-ray diffraction measurements revealed a homogeneously strained EuTiO thin film with a strain dependency on the laser fluence during the film growth. From magnetization vs temperature measurements, we confirmed that the strained EuTiO films have an antiferromagnetic to ferromagnetic transition at 3.7 K, which disappeared for unstrained films. Furthermore, we used electron backscatter diffraction to analyze the columnar growth of EuTiO on YSZ, which showed four in-plane orientations.

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Metadaten
Author:Florian JungORCiD, Helmut KarlORCiDGND
URN:urn:nbn:de:bvb:384-opus4-963043
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/96304
ISSN:0021-8979OPAC
ISSN:1089-7550OPAC
Parent Title (English):Journal of Applied Physics
Publisher:AIP Publishing
Place of publication:Melville, NY
Type:Article
Language:English
Year of first Publication:2022
Publishing Institution:Universität Augsburg
Release Date:2022/06/27
Tag:General Physics and Astronomy
Volume:131
Issue:20
First Page:205303
DOI:https://doi.org/10.1063/5.0092582
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik / Lehrstuhl für Experimentalphysik IV
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Licence (German):CC-BY 4.0: Creative Commons: Namensnennung (mit Print on Demand)