Physical properties of semi‐insulating polycrystalline silicon: III. Infrared diagnosis of the polycrystalline‐Si/c‐Si interface

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Metadaten
Author:P. Brüesch, Th. Stockmeier, F. Stucki, P. A. Buffat, J. K. N. Lindner
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/111429
ISSN:0021-8979OPAC
ISSN:1089-7550OPAC
Parent Title (English):Journal of Applied Physics
Publisher:AIP Publishing
Place of publication:Melville, NY
Type:Article
Language:English
Year of first Publication:1993
Release Date:2024/02/19
Tag:General Physics and Astronomy
Volume:73
Issue:11
First Page:7701
Last Page:7707
DOI:https://doi.org/10.1063/1.353967
Institutes:Mathematisch-Naturwissenschaftlich-Technische Fakultät
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik