Physical properties of semi‐insulating polycrystalline silicon: III. Infrared diagnosis of the polycrystalline‐Si/c‐Si interface
Author: | P. Brüesch, Th. Stockmeier, F. Stucki, P. A. Buffat, J. K. N. Lindner |
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Frontdoor URL | https://opus.bibliothek.uni-augsburg.de/opus4/111429 |
ISSN: | 0021-8979OPAC |
ISSN: | 1089-7550OPAC |
Parent Title (English): | Journal of Applied Physics |
Publisher: | AIP Publishing |
Place of publication: | Melville, NY |
Type: | Article |
Language: | English |
Year of first Publication: | 1993 |
Release Date: | 2024/02/19 |
Tag: | General Physics and Astronomy |
Volume: | 73 |
Issue: | 11 |
First Page: | 7701 |
Last Page: | 7707 |
DOI: | https://doi.org/10.1063/1.353967 |
Institutes: | Mathematisch-Naturwissenschaftlich-Technische Fakultät |
Mathematisch-Naturwissenschaftlich-Technische Fakultät / Institut für Physik |