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Observation of a resonance in the spin-orbit scattering of 5(s, p) impurities in Mg and Cu (1993)

Geier, Stephan ; Bergmann, G. ; Papanikolaou, N. ; Stefanou, N. ; Dederichs, P. H.

Characterization of the near-interface region of chemical vapor deposited diamond films on silicon by backscatter Kikuchi diffraction (1994)

Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Kunze, K. ; Adams, B. L.

Optimization of the texture of epitaxially nucleated diamond films on silicon (1994)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

Methods of characterizing the texture of CVD diamond films (1994)

Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Helming, K. ; Kunze, K.

Structural characterization of diamond films grown epitaxially on silicon (1994)

Schreck, Matthias ; Hessmer, Rainer ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

Correlation between breakdown voltage and structural properties of polycrystalline and heteroepitaxial CVD diamond films (1994)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Stritzker, Bernd

Texture estimates by means of components: dedicated to Professor Dr. rer. nat. Dr. h.c. Hans-Joachim Bunge on the occasion of his 65th birthday (1994)

Helming, Kurt ; Schwarzer, Robert A. ; Rauschenbach, Bernd ; Geier, Stephan ; Leiss, Bernd ; Wenk, Heinz-R. ; Ullemeyer, Klaus ; Heinitz, Joachim

The influence of the growth process on the film texture of epitaxially nucleated diamond on silicon (001) (1995)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

X-ray imaging of polycrystalline materials (1995)

Wroblewski, T. ; Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Rauschenbach, Bernd

Heteroepitaxial growth of thin C-60 films on mica (001) (1995)

Henke, Sascha ; Thürer, Karl-Heinz ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

X-ray pole figure study of the epitaxial growth of C60-thin films on mica (001) (1995)

Henke, Sascha ; Thürer, Karl-Heinz ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

Texture analysis of CVD diamond films on silicon by the component method (1995)

Helming, K. ; Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Stritzker, Bernd ; Rauschenbach, Bernd

Textur- und Spannungsanalyse an dünnen epitaktischen Diamantschichten auf Silizium (1996)

Geier, Stephan

Study of the initial growth phase of chemical vapor deposited diamond on silicon (001) by synchrotron radiation (1996)

Geier, Stephan ; Hessmer, Rainer ; Preckwinkel, Uwe ; Schweitzer, Dirk ; Schreck, Matthias ; Rauschenbach, Bernd

Study of the growth of thin epitaxial CVD diamond films on silicon (1996)

Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Stritzker, Bernd ; Rauschenbach, Bernd ; Helming, Kurt ; Kunze, Karsten ; Erfurth, W.

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