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Has Fulltext

  • no (14)

Author

  • Hessmer, Rainer (13)
  • Schreck, Matthias (13)
  • Stritzker, Bernd (11)
  • Geier, Stephan (10)
  • Rauschenbach, Bernd (9)
  • Helming, K. (2)
  • Kunze, K. (2)
  • Adams, B. L. (1)
  • Erfurth, W. (1)
  • Helming, Kurt (1)
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Year of publication

  • 1996 (5)
  • 1995 (4)
  • 1994 (5)

Document Type

  • Article (10)
  • Part of a Book (3)
  • Doctoral Thesis (1)

Language

  • English (13)
  • German (1)

Institute

  • Institut für Physik (14)
  • Mathematisch-Naturwissenschaftlich-Technische Fakultät (14)
  • Lehrstuhl für Experimentalphysik IV (13)

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Characterization of the near-interface region of chemical vapor deposited diamond films on silicon by backscatter Kikuchi diffraction (1994)
Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Kunze, K. ; Adams, B. L.
Optimization of the texture of epitaxially nucleated diamond films on silicon (1994)
Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd
Methods of characterizing the texture of CVD diamond films (1994)
Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Helming, K. ; Kunze, K.
Structural characterization of diamond films grown epitaxially on silicon (1994)
Schreck, Matthias ; Hessmer, Rainer ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd
Correlation between breakdown voltage and structural properties of polycrystalline and heteroepitaxial CVD diamond films (1994)
Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Stritzker, Bernd
Indications of non-monotonic texture evolution from a two-dimensional simulation study (1995)
Hessmer, Rainer ; Schreck, Matthias ; Stritzker, Bernd
The influence of the growth process on the film texture of epitaxially nucleated diamond on silicon (001) (1995)
Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd
X-ray imaging of polycrystalline materials (1995)
Wroblewski, T. ; Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Rauschenbach, Bernd
Texture analysis of CVD diamond films on silicon by the component method (1995)
Helming, K. ; Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Stritzker, Bernd ; Rauschenbach, Bernd
Herstellung und Charakterisierung heteroepitaktischer Diamantschichten auf Silizium (1996)
Heßmer, Rainer
Study of the initial growth phase of chemical vapor deposited diamond on silicon (001) by synchrotron radiation (1996)
Geier, Stephan ; Hessmer, Rainer ; Preckwinkel, Uwe ; Schweitzer, Dirk ; Schreck, Matthias ; Rauschenbach, Bernd
AFM-study on the non-monotonic texture evolution of heteroepitaxially nucleated diamond films (1996)
Klarmann, Ralph ; Schreck, Matthias ; Hessmer, Rainer ; Stritzker, Bernd
High field electrical conductivity and breakdown in heteroepitaxial diamond film (1996)
Schröppel, Stefan ; Hessmer, Rainer ; Schreck, Matthias ; Stritzker, Bernd
Study of the growth of thin epitaxial CVD diamond films on silicon (1996)
Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Stritzker, Bernd ; Rauschenbach, Bernd ; Helming, Kurt ; Kunze, Karsten ; Erfurth, W.
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