Towards reliable parameter extraction in MEMS final module testing using Bayesian inference

  • In micro-electro-mechanical systems (MEMS) testing high overall precision and reliability are essential. Due to the additional requirement of runtime efficiency, machine learning methods have been investigated in recent years. However, these methods are often associated with inherent challenges concerning uncertainty quantification and guarantees of reliability. The goal of this paper is therefore to present a new machine learning approach in MEMS testing based on Bayesian inference to determine whether the estimation is trustworthy. The overall predictive performance as well as the uncertainty quantification are evaluated with four methods: Bayesian neural network, mixture density network, probabilistic Bayesian neural network and BayesFlow. They are investigated under the variation in training set size, different additive noise levels, and an out-of-distribution condition, namely the variation in the damping factor of the MEMS device. Furthermore, epistemic and aleatoricIn micro-electro-mechanical systems (MEMS) testing high overall precision and reliability are essential. Due to the additional requirement of runtime efficiency, machine learning methods have been investigated in recent years. However, these methods are often associated with inherent challenges concerning uncertainty quantification and guarantees of reliability. The goal of this paper is therefore to present a new machine learning approach in MEMS testing based on Bayesian inference to determine whether the estimation is trustworthy. The overall predictive performance as well as the uncertainty quantification are evaluated with four methods: Bayesian neural network, mixture density network, probabilistic Bayesian neural network and BayesFlow. They are investigated under the variation in training set size, different additive noise levels, and an out-of-distribution condition, namely the variation in the damping factor of the MEMS device. Furthermore, epistemic and aleatoric uncertainties are evaluated and discussed to encourage thorough inspection of models before deployment striving for reliable and efficient parameter estimation during final module testing of MEMS devices. BayesFlow consistently outperformed the other methods in terms of the predictive performance. As the probabilistic Bayesian neural network enables the distinction between epistemic and aleatoric uncertainty, their share of the total uncertainty has been intensively studied.show moreshow less

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Metadaten
Author:Monika E. Heringhaus, Yi ZhangGND, André Zimmermann, Lars MikelsonsORCiDGND
URN:urn:nbn:de:bvb:384-opus4-973372
Frontdoor URLhttps://opus.bibliothek.uni-augsburg.de/opus4/97337
ISSN:1424-8220OPAC
Parent Title (English):Sensors
Publisher:MDPI
Place of publication:Basel
Type:Article
Language:English
Date of first Publication:2022/07/20
Publishing Institution:Universität Augsburg
Release Date:2022/08/25
Tag:MEMS testing; parameter extraction; uncertainty quantification; Bayesian inference; BayesFlow
Volume:22
Issue:14
First Page:5408
DOI:https://doi.org/10.3390/s22145408
Institutes:Fakultät für Angewandte Informatik
Fakultät für Angewandte Informatik / Institut für Informatik
Fakultät für Angewandte Informatik / Institut für Informatik / Lehrstuhl für Ingenieurinformatik mit Schwerpunkt Mechatronik
Dewey Decimal Classification:0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 004 Datenverarbeitung; Informatik
Licence (German):CC-BY 4.0: Creative Commons: Namensnennung (mit Print on Demand)