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Characterization of the near-interface region of chemical vapor deposited diamond films on silicon by backscatter Kikuchi diffraction (1994)

Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Kunze, K. ; Adams, B. L.

Optimization of the texture of epitaxially nucleated diamond films on silicon (1994)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

Methods of characterizing the texture of CVD diamond films (1994)

Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Rauschenbach, Bernd ; Stritzker, Bernd ; Helming, K. ; Kunze, K.

Structural characterization of diamond films grown epitaxially on silicon (1994)

Schreck, Matthias ; Hessmer, Rainer ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

Correlation between breakdown voltage and structural properties of polycrystalline and heteroepitaxial CVD diamond films (1994)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Stritzker, Bernd

The influence of the growth process on the film texture of epitaxially nucleated diamond on silicon (001) (1995)

Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd

X-ray imaging of polycrystalline materials (1995)

Wroblewski, T. ; Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Rauschenbach, Bernd

Texture analysis of CVD diamond films on silicon by the component method (1995)

Helming, K. ; Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Stritzker, Bernd ; Rauschenbach, Bernd

Study of the initial growth phase of chemical vapor deposited diamond on silicon (001) by synchrotron radiation (1996)

Geier, Stephan ; Hessmer, Rainer ; Preckwinkel, Uwe ; Schweitzer, Dirk ; Schreck, Matthias ; Rauschenbach, Bernd

Study of the growth of thin epitaxial CVD diamond films on silicon (1996)

Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Stritzker, Bernd ; Rauschenbach, Bernd ; Helming, Kurt ; Kunze, Karsten ; Erfurth, W.

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