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(3)
Author
Geier, Stephan
(3)
Hessmer, Rainer
(3)
Rauschenbach, Bernd
(3)
Schreck, Matthias
(3)
Stritzker, Bernd
(2)
Helming, K.
(1)
Wroblewski, T.
(1)
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1995 (3)
(remove)
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Article
(3)
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English
(3)
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Institut für Physik
(3)
Lehrstuhl für Experimentalphysik IV
(3)
Mathematisch-Naturwissenschaftlich-Technische Fakultät
(3)
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The influence of the growth process on the film texture of epitaxially nucleated diamond on silicon (001)
(1995)
Hessmer, Rainer
;
Schreck, Matthias
;
Geier, Stephan
;
Rauschenbach, Bernd
;
Stritzker, Bernd
X-ray imaging of polycrystalline materials
(1995)
Wroblewski, T.
;
Geier, Stephan
;
Hessmer, Rainer
;
Schreck, Matthias
;
Rauschenbach, Bernd
Texture analysis of CVD diamond films on silicon by the component method
(1995)
Helming, K.
;
Geier, Stephan
;
Schreck, Matthias
;
Hessmer, Rainer
;
Stritzker, Bernd
;
Rauschenbach, Bernd
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