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Has Fulltext

  • no (3)

Author

  • Geier, Stephan (3)
  • Hessmer, Rainer (3)
  • Rauschenbach, Bernd (3)
  • Schreck, Matthias (3)
  • Stritzker, Bernd (2)
  • Helming, K. (1)
  • Wroblewski, T. (1)

Year of publication

  • 1995 (3) (remove)

Document Type

  • Article (3)

Language

  • English (3)

Institute

  • Institut für Physik (3)
  • Lehrstuhl für Experimentalphysik IV (3)
  • Mathematisch-Naturwissenschaftlich-Technische Fakultät (3)

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The influence of the growth process on the film texture of epitaxially nucleated diamond on silicon (001) (1995)
Hessmer, Rainer ; Schreck, Matthias ; Geier, Stephan ; Rauschenbach, Bernd ; Stritzker, Bernd
X-ray imaging of polycrystalline materials (1995)
Wroblewski, T. ; Geier, Stephan ; Hessmer, Rainer ; Schreck, Matthias ; Rauschenbach, Bernd
Texture analysis of CVD diamond films on silicon by the component method (1995)
Helming, K. ; Geier, Stephan ; Schreck, Matthias ; Hessmer, Rainer ; Stritzker, Bernd ; Rauschenbach, Bernd
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